Temperature dependence analysis of on-state resistance of a high-voltage LDMOS at very high temperatures

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作者
Ke, Dao-Ming [1 ]
Chen, Jun-Ning [1 ]
机构
[1] Electron. Eng. Dept. of Anhui Univ., Hefei 230061, China
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Calculations - Electric resistance - Equivalent circuits - Temperature;
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摘要
The paper gives the equivalent circuit of a high voltage LDMOS at very high temperatures, and analyzes performance of leakage current and intrinsic parameters of a LDMOS from 25°C to 300 °C. It may be concluded that the maximal applied temperature of a LDMOS is determined by the reverse leakage current of a pn junction across gate and drain, and the relationship between on resistance and temperature is (T/T1)y(y is 1.5 to 2.5).
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页码:1111 / 1113
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