Relationship between microstructure and electrical properties of ZnO-based multilayer varistor

被引:0
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作者
Lee, Wen-Hsi [1 ]
Chen, Wei-Ting [1 ]
Lee, Ying-Chieh [2 ]
Lin, Shih-Pin [2 ]
Yang, Tony [2 ]
机构
[1] Department of Electrical Engineering, National Cheng Kung University, Taiwan, Taiwan
[2] RandD Technology Center, Yageo Corporation Nantze Branch, Taiwan, Taiwan
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Journal article (JA)
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页码:5126 / 5131
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