Relationship between microstructure and electrical properties of ZnO-based multilayer varistor

被引：0
|
作者：
Lee, Wen-Hsi [1 ]
Chen, Wei-Ting [1 ]
Lee, Ying-Chieh [2 ]
Lin, Shih-Pin [2 ]
Yang, Tony [2 ]
机构：
[1] Department of Electrical Engineering, National Cheng Kung University, Taiwan, Taiwan
[2] RandD Technology Center, Yageo Corporation Nantze Branch, Taiwan, Taiwan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2006年 / 45卷 / 6 A期
关键词：
11;
D O I：
暂无
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摘要：
Journal article (JA)
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页码：5126 / 5131
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