An approach to measure pixel pitch of CCD Camera System by using structure diffraction of TFT-LCD

被引：0

|

作者：

Hu, Wen-Gang ^{[1
]}

Wang, Yong-Zhong ^{[1
]}

Hua, Wen-Shen ^{[1
]}

机构：

[1] Department of Optical and Electronic Engineering, Ordnance Engineering College, Shijiazhuang 050003, China

来源：

Guangzi Xuebao/Acta Photonica Sinica | 2008年 / 37卷 / 06期

关键词：

D O I：

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学科分类号：

摘要：

Diffraction

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页码：1242 / 1245

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