Testing capability indices for one-sided processes with measurement errors

被引：0
|
作者：
Grau, D. [1 ]
机构：
[1] Laboratory of Applied Mathematics, CNRS UMR 5142 IUT de Bayonne, Université de Pau et des Pays de l'Adour, 17 place Paul Bert, 64100 Bayonne, France
来源：
International Journal of Metrology and Quality Engineering | 2013年 / 4卷 / 02期
关键词：
Capability indices - Critical value - Gauge measurement errors - Manufacturing industries - Measuring instruments - Process capability indices - Process performance - Product characteristics;
D O I：
10.1051/ijmqe/2013049
中图分类号：
学科分类号：
摘要：
In the manufacturing industry, many product characteristics are of one-sided tolerances. The process capability indices Cpu (u, v) and Cpl (u, v) can be used to measure process performance. Most research work related to capability indices assumes no gauge measurement errors. This assumption insufficiently reflects real situations even when advanced measuring instruments are used. In this paper we show that using a critical value without taking into account these errors, severely underestimates the α-risk which causes a less accurate testing capacity. In order to improve the results we suggest the use of an adjusted critical value, and we give a Maple program to get it. An example in a polymer granulates manufactory is presented to illustrate this approach. © 2013 EDP Sciences.
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页码：71 / 80
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