A Sampling Scheme for Resubmitted Lots Based on One-Sided Capability Indices

被引:30
|
作者
Kurniati, Nani [1 ]
Yeh, Ruey-Huei [1 ]
Wu, Chien-Wei [2 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Ind Management, Taipei, Taiwan
[2] Natl Tsing Hua Univ, Dept Ind Engn & Engn Management, Hsinchu, Taiwan
来源
关键词
Acceptance sampling; one-sided specification limit; process yield; sampling plan; INSPECTION SCHEME; PLAN; FRACTION;
D O I
10.1080/16843703.2015.11673433
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Acceptance sampling plans provide decision rules for lot acceptance determination based on the required quality levels and allowable risks. In this paper, we develop a variables sampling plan based on the one-sided process capability indices, C-PU and C-PL, when lot resubmissions are permitted on non-acceptance of the original inspection. The plan parameters are determined by solving two non-linear equations simultaneously and fulfill the two-point condition on the operating characteristic (OC) curve. The OC curve of the proposed plan is derived based on the exact sampling distribution rather than approximation. Moreover, the behavior of the proposed resubmitted sampling plan for various parameters is examined and discussed. For practical purposes, the sample size and critical acceptance value are tabulated for various parameter values. An example is used to demonstrate the implementation of the proposed resubmitted sampling plan.
引用
收藏
页码:501 / 515
页数:15
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