Families of capability indices for one-sided specification limits

被引:18
|
作者
Vannman, K [1 ]
机构
[1] Lulea Univ Technol, Div Qual Technol & Stat, SE-97187 Lulea, Sweden
关键词
capability indices; one-sided specification limits; estimation; distribution;
D O I
10.1080/02331889808802625
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
We study, when the specification interval is one-sided, two new classes of indices, which are based on the classes of indices for asymmetric tolerances earlier defined by Vannman. These classes generalize indices for one-sided specification limits earlier suggested in the literature. By varying the parameters of the classes various indices with suitable properties can be obtained. Under the assumption of normality explicit forms of the distributions of the two new classes of the estimated indices are provided. Numerical investigations are made to explore the behavior of the estimators of the indices for different values of the parameters. Based on the estimators a decision rule that can be used to determine whether the process can be considered capable or not is provided and suitable criteria for choosing an index from the families are suggested.
引用
收藏
页码:43 / 66
页数:24
相关论文
共 50 条
  • [1] Fuzzy process capability plots for families of one-sided specification limits
    Moradi, Vahab
    Gildeh, Bahram Sadeghpour
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2013, 64 (1-4): : 357 - 367
  • [2] Fuzzy process capability plots for families of one-sided specification limits
    Vahab Moradi
    Bahram Sadeghpour Gildeh
    [J]. The International Journal of Advanced Manufacturing Technology, 2013, 64 : 357 - 367
  • [3] Developing a Novel Fuzzy Evaluation Model by One-Sided Specification Capability Indices
    Lo, Wei
    Yang, Chun-Ming
    Lai, Kuei-Kuei
    Li, Shao-Yu
    Chen, Chi-Han
    [J]. MATHEMATICS, 2021, 9 (10)
  • [4] Control charts for one-sided capability indices
    Chen, K. S.
    Huang, H. L.
    Huang, Chiao Tzu
    [J]. QUALITY & QUANTITY, 2007, 41 (03) : 413 - 427
  • [5] Control Charts for One-sided Capability Indices
    K. S. Chen
    H. L. Huang
    Chiao Tzu Huang
    [J]. Quality & Quantity, 2007, 41 : 413 - 427
  • [6] Fuzzy Testing for One-Sided Process Capability Indices
    Yen, Ching-Ho
    [J]. COMMUNICATIONS IN STATISTICS-THEORY AND METHODS, 2012, 41 (09) : 1603 - 1616
  • [7] New Process Capability Indices for One-Sided Tolerances
    Grau, Daniel
    [J]. QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT, 2009, 6 (02): : 107 - 124
  • [8] Process capability induces for one-sided specification intervals and skewed distributions
    Vannman, Kerstin
    Albing, Malin
    [J]. QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 2007, 23 (06) : 755 - 765
  • [9] Process Yield for Multivariate Linear Profiles with One-sided Specification Limits
    Wang, Fu-Kwun
    Tamirat, Yeneneh
    [J]. QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 2016, 32 (04) : 1281 - 1293
  • [10] A Sampling Scheme for Resubmitted Lots Based on One-Sided Capability Indices
    Kurniati, Nani
    Yeh, Ruey-Huei
    Wu, Chien-Wei
    [J]. QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT, 2015, 12 (04): : 501 - 515