Stability of field emitter array in microwave tubes

被引：0
|
作者：
Feng, Jinjun [1 ]
机构：
[1] Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100016, China
来源：
Zhenkong Kexue yu Jishu Xuebao/Journal of Vacuum Science and Technology | 2005年 / 25卷 / SUPPL.期
关键词：
Electric discharges - Electric fields - Electron guns - Ion bombardment - Light emitting diodes - Operations research - Partial pressure - Stability - Vacuum technology;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Influence of various factors, including partial pressure of residual gases, high voltage discharge and ion bombardment around the electron gun, on operation stability and lifetime of the microwave tubes fabricated with field emitter array (FEA) was analyzed. Feasible ways, involving emitter materials, FEA structures, degassing and sealing of the tubes, were proposed to improve stability and lifetime of the FEA in the microwave tubes.
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页码：16 / 19
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