The Impact of Displacement Defect in Nanosheet Field Effect Transistor

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作者：
Kim, Jungsik [1 ,2 ]
机构：
[1] [1,Kim, Jungsik
来源：
Kim, Jungsik (jungsik@gnu.ac.kr) | 1600年 / Korean Institute of Electrical Engineers卷 / 16期
关键词：
Nanosheets;
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页码：525 / 529
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