Deep levels in the MBE ZnO:As/n-GaN diodes – Photoluminescence, electrical properties and deep level transient spectroscopy

被引:0
|
作者
机构
[1] Zielony, E.
[2] Przezdziecka, E.
[3] Placzek-Popko, E.
[4] Lisowski, W.
[5] Stachowicz, M.
[6] Paradowska, K.M.
[7] Jakiela, R.
[8] Kozanecki, A.
来源
Zielony, E. (eunika.zielony@pwr.edu.pl) | 1600年 / Elsevier Ltd卷 / 742期
关键词
The research was partially supported by the statutory grant of Wroclaw University of Science and Technology; 0401/0009/17; by the NCN project DEC-2013/09/D/ST3/03750 and by the Polish National Centre for Research and Development (NCBiR) through the project PBS2/A5/34/2013. Author K.M.P would like to acknowledge the financial support in the form of scholarship from the special-purpose grant awarded to the Faculty of Fundamental Problems of Technology by Ministry of Science and Higher Education in 2017 for scientific research or development and related tasks; for young scientists and Ph.D students;
D O I
暂无
中图分类号
学科分类号
摘要
54
引用
收藏
相关论文
共 50 条
  • [21] Structural and electrical properties of Mo/n-GaN Schottky diodes
    Reddy, VR
    Ramesh, CK
    Choi, CJ
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2006, 203 (03): : 622 - 627
  • [22] Electrical characterization of InGaN/GaN quantum dots by deep level transient spectroscopy
    Kim, JS
    Kim, EK
    Kim, HJ
    Yoon, E
    Park, IW
    Park, YJ
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2004, 241 (12): : 2811 - 2815
  • [23] Deep level transient spectroscopy on light-emitting diodes based on (In,Ga) N/GaN nanowire ensembles
    Musolino, M.
    Meneghini, M.
    Scarparo, L.
    De Santi, C.
    Tahraoui, A.
    Geelhaar, L.
    Zanoni, E.
    Riechert, H.
    GALLIUM NITRIDE MATERIALS AND DEVICES X, 2015, 9363
  • [24] Deep levels in as-grown and electron-irradiated n-type GaN studied by deep level transient spectroscopy and minority carrier transient spectroscopy
    Tran Thien Duc
    Pozina, Galia
    Nguyen Tien Son
    Kordina, Olof
    Janzen, Erik
    Ohshima, Takeshi
    Hemmingsson, Carl
    JOURNAL OF APPLIED PHYSICS, 2016, 119 (09)
  • [25] Deep Level Transient Fourier Spectroscopy (DLTFS) and Isothermal Transient Spectroscopy (ITS) in vertical GaN-on-GaN Schottky barrier diodes
    Raja, P. Vigneshwara
    Raynaud, Christophe
    Sonneville, Camille
    Morel, Herve
    Phung, Luong Viet
    Ngo, Thi Huong
    De Mierry, Philippe
    Frayssinet, Eric
    Maher, Hassan
    Cordier, Yvon
    Planson, Dominique
    MICRO AND NANOSTRUCTURES, 2022, 172
  • [26] Deep levels in AlGaN/GaN HEMTs on silicon substrate are characterized by current deep level transient spectroscopy
    Mosbahi, H.
    Gassoumi, M.
    Gaquiere, C.
    Zaidi, M. A.
    Maaref, H.
    OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, 2010, 4 (11): : 1783 - 1785
  • [27] Bias-dependent deep level in HVPE n-GaN
    Wu, L
    Meyer, WE
    Auret, FD
    Hayes, M
    PHYSICA B-CONDENSED MATTER, 2003, 340 : 475 - 478
  • [28] Impact of proton irradiation on deep level states in n-GaN
    Zhang, Z.
    Arehart, A. R.
    Cinkilic, E.
    Chen, J.
    Zhang, E. X.
    Fleetwood, D. M.
    Schrimpf, R. D.
    McSkimming, B.
    Speck, J. S.
    Ringel, S. A.
    APPLIED PHYSICS LETTERS, 2013, 103 (04)
  • [29] Capacitance transient spectroscopy analysis for deep levels in GaN
    Hacke, P
    Nakayama, H
    Detchprohm, T
    Hiramatsu, K
    Sawaki, N
    BLUE LASER AND LIGHT EMITTING DIODES, 1996, : 184 - 187
  • [30] Acceptor levels in GaSe:In crystals investigated by deep-level transient spectroscopy and photoluminescence
    Cui, Yunlong
    Dupere, Ryan
    Burger, Arnold
    Johnstone, D.
    Mandal, Krishna C.
    Payne, S. A.
    JOURNAL OF APPLIED PHYSICS, 2008, 103 (01)