Deep levels in the MBE ZnO:As/n-GaN diodes – Photoluminescence, electrical properties and deep level transient spectroscopy

被引:0
|
作者
机构
[1] Zielony, E.
[2] Przezdziecka, E.
[3] Placzek-Popko, E.
[4] Lisowski, W.
[5] Stachowicz, M.
[6] Paradowska, K.M.
[7] Jakiela, R.
[8] Kozanecki, A.
来源
Zielony, E. (eunika.zielony@pwr.edu.pl) | 1600年 / Elsevier Ltd卷 / 742期
关键词
The research was partially supported by the statutory grant of Wroclaw University of Science and Technology; 0401/0009/17; by the NCN project DEC-2013/09/D/ST3/03750 and by the Polish National Centre for Research and Development (NCBiR) through the project PBS2/A5/34/2013. Author K.M.P would like to acknowledge the financial support in the form of scholarship from the special-purpose grant awarded to the Faculty of Fundamental Problems of Technology by Ministry of Science and Higher Education in 2017 for scientific research or development and related tasks; for young scientists and Ph.D students;
D O I
暂无
中图分类号
学科分类号
摘要
54
引用
收藏
相关论文
共 50 条
  • [1] Deep levels in the MBE ZnO: As/n-GaN diodes - Photoluminescence, electrical properties and deep level transient spectroscopy
    Zielony, E.
    Przezdziecka, E.
    Placzek-Popko, E.
    Lisowski, W.
    Stachowicz, M.
    Paradowska, K. M.
    Jakiela, R.
    Kozanecki, A.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2018, 742 : 296 - 303
  • [2] High Resolution Laplace Deep Level Transient Spectroscopy Studies of Shallow and Deep Levels in n-GaN
    Emiroglu, D.
    Evans-Freeman, J.
    Kappers, M. J.
    McAleese, C.
    Humphreys, C. J.
    COMMAD: 2008 CONFERENCE ON OPTOELECTRONIC AND MICROELECTRONIC MATERIALS & DEVICES, 2008, : 30 - +
  • [3] Emission and capture characteristics of deep hole trap in n-GaN by optical deep level transient spectroscopy
    Sui, Jin
    Chen, Jiaxiang
    Qu, Haolan
    Zhang, Yu
    Lu, Xing
    Zou, Xinbo
    JOURNAL OF SEMICONDUCTORS, 2024, 45 (03)
  • [4] Emission and capture characteristics of deep hole trap in n-GaN by optical deep level transient spectroscopy
    Jin Sui
    Jiaxiang Chen
    Haolan Qu
    Yu Zhang
    Xing Lu
    Xinbo Zou
    Journal of Semiconductors, 2024, 45 (03) : 69 - 75
  • [5] Deep levels in n-GaN Doped with Carbon Studied by Deep Level and Minority Carrier Transient Spectroscopies
    Honda, Unhi
    Yamada, Yujiro
    Tokuda, Yutaka
    Shiojima, Kenji
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, 51 (04)
  • [6] Conductance Deep-Level Transient Spectroscopy and Current Transport Mechanisms in Au|Pt|n-GaN Schottky Barrier Diodes
    Gassoumi, M.
    PHYSICS OF THE SOLID STATE, 2020, 62 (04) : 636 - 641
  • [7] Conductance Deep-Level Transient Spectroscopy and Current Transport Mechanisms in Au|Pt|n-GaN Schottky Barrier Diodes
    M. Gassoumi
    Physics of the Solid State, 2020, 62 : 636 - 641
  • [8] Charge deep level transient spectroscopy of electron traps in MOVPE grown n-GaN on sapphire
    Mahmood, Zahid Hasan
    Shah, A. P.
    Kadir, Abdul
    Gokhale, M. R.
    Bhattacharya, Arnab
    Arora, B. M.
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2008, 245 (11): : 2567 - 2571
  • [9] Deep levels in GaN studied by deep level transient spectroscopy and Laplace transform deep-level spectroscopy
    Kamyczek, Paulina
    Placzek-Popko, Ewa
    Zielony, Eunika
    Zytkiewicz, Zbigniew
    MATERIALS SCIENCE-POLAND, 2013, 31 (04): : 572 - 576
  • [10] Characterization of deep levels in n-GaN by combined capacitance transient techniques
    Py, MA
    Zellweger, C
    Wagner, V
    Carlin, JF
    Buehlmann, HJ
    Ilegems, M
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2005, 202 (04): : 572 - 577