A digital metrology process model (MPM) for measuring planning and data analysis and its application with a computer-aided system

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[1] Chen, Zhehan
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Chen, Zhehan (cloudy731@163.com) | 1967年 / Springer London卷 / 92期
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Computer aided analysis - Data mining - Information management - Product design - Data handling - Fighter aircraft - Digital devices;
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页码：5 / 8
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