A digital metrology process model (MPM) for measuring planning and data analysis and its application with a computer-aided system

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[1] Chen, Zhehan

来源：

Chen, Zhehan (cloudy731@163.com) | 1967年 / Springer London卷 / 92期

关键词：

Computer aided analysis - Data mining - Information management - Product design - Data handling - Fighter aircraft - Digital devices;

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页码：5 / 8

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