Investigation of diffusion barrier properties and thermal stability of ultrathin nano-crystal Zr-N films

被引:0
|
作者
Ding, Ming-Hui [1 ]
Zhang, Li-Li [1 ]
Gai, Deng-Yu [1 ]
Wang, Ying [2 ]
机构
[1] College of Material Science and Chemistry Engineering, Harbin Engineering University, Harbin 150001, China
[2] School of Electronics and Information Engineering, Harbin Engineering University, Harbin 150001, China
来源
关键词
18;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:1545 / 1548
相关论文
共 50 条
  • [1] Investigation of Zr-N thin films for use as diffusion barrier in Cu metallization
    Wang, Ying
    Cao, Fei
    Ding, Minghui
    Yang, Dawei
    MICROELECTRONICS JOURNAL, 2007, 38 (8-9) : 910 - 914
  • [2] Effect of sputtering temperature on the diffusion barrier properties of Zr-N thin films
    College of Material Science and Chemistry Engineering, Harbin Engineering University, Harbin 150001, China
    不详
    不详
    Gongneng Cailiao, 2008, 10 (1612-1614):
  • [3] Effect of substrate bias voltages on the diffusion barrier properties of Zr-N films in Cu metallization
    Wang, Ying
    Zhao, Chunhui
    Song, Zhongxiao
    Cao, Fei
    Yang, Dawei
    APPLIED SURFACE SCIENCE, 2007, 253 (22) : 8858 - 8862
  • [4] Barrier capability of Zr-N films with titanium addition against copper diffusion
    Wang, Ying
    Cao, Fei
    Yang, Xiao-dong
    Ding, Ming-hui
    MATERIALS CHEMISTRY AND PHYSICS, 2009, 117 (2-3) : 425 - 429
  • [5] STRUCTURAL STABILITY AND THERMODYNAMIC PROPERTIES OF ZR-N ALLOYS
    OGAWA, T
    JOURNAL OF ALLOYS AND COMPOUNDS, 1994, 203 (1-2) : 221 - 227
  • [6] Diffusion barrier performance of Zr-N/Zr bilayered film in Cu/Si contact system
    Wang, Ying
    Cao, Fei
    Ding, Ming-hui
    Liu, Yun-tao
    MICROELECTRONICS RELIABILITY, 2008, 48 (11-12) : 1800 - 1803
  • [7] Thermal stability of ultra thin Zr-B-N films as diffusion barrier between Cu and Si
    Meng, Y.
    Song, Z. X.
    Li, Y. H.
    Qian, D.
    Hu, W.
    Xu, K. W.
    APPLIED SURFACE SCIENCE, 2020, 527
  • [8] The study of Zr-Si-N diffusion barrier and its thermal stability
    Song, ZX
    Ding, L
    Xu, KW
    Cheng, H
    RARE METAL MATERIALS AND ENGINEERING, 2005, 34 (03) : 459 - 462
  • [9] Properties of Zr-N thin films prepared by the ion and vapour deposition method
    Matsuoka, M
    Kuratani, N
    Ogata, K
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1996, 15 (15) : 1340 - 1342
  • [10] Effect of substrate temperature on the thermal stability of Cu/Zr-N/Si contact system
    Wang, Ying
    Zhao, Chunhui
    Cao, Fei
    Shao, Lei
    MATERIALS LETTERS, 2008, 62 (03) : 418 - 421