Contactless mapping of lifetime and diffusion length scan map of minority carriers in silicon wafers

被引：0
|
作者：
Palais, O. [1 ]
Gervais, J. [1 ]
Yakimov, E. [1 ]
Martinuzzi, S. [1 ]
机构：
[1] Lab. de Photoelectricite LPDSO, Université de Marseilles, 13397 Marseille Cedex 20, France
来源：
EPJ Applied Physics | 2000年 / 10卷 / 02期
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摘要：
20
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页码：157 / 162
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