Application of dual-processor in intelligent tester

被引：0
|
作者：
Liu, Hai-Feng [1 ]
Liu, Bai-Fen [1 ]
机构：
[1] School of Electrical and Electronic Engineering, East China Jiaotong University, Nanchang 330013, China
来源：
Dianli Zidonghua Shebei / Electric Power Automation Equipment | 2005年 / 25卷 / 11期
关键词：
Data communication systems - Data reduction - Digital signal processing - Electric power distribution - Intelligent structures;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
According to the development trend of modern tester, a multi-functional intelligent tester with two processors is developed and tested. The working principle and internal structure of AD7714 are introduced in detail. TMS320LF2407A is adopted for digital signal processing. Because the computing speed of DSP is much faster than that of MCU, a solution is provided for data transmission between DSP and MCU. Tests are carried out in lab and the measured data show its good performance and application prospect.
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