New approach to conform feature samples for fault diagnosis classifiers

被引：0
|
作者：
Xie, P. [1 ]
Zhang, Z. [1 ]
机构：
[1] Department of Electronic Engineering, Nanjing Inst. of Posts and Telecom., Jiangsu Nanjing 210003, China
来源：
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2001年 / 23卷 / 11期
关键词：
D O I：
暂无
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学科分类号：
摘要：
7
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页码：35 / 37
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