Preparation and characterization of CeO2/YSZ/CeO2 buffer layers for YBCO coated conductors

被引：0

作者：

Xiong, Jie ^{[1
]}

Chen, Yin ^{[1
]}

Qiu, Yang ^{[1
]}

Tao, Bowan ^{[1
]}

Qin, Wenfeng ^{[1
]}

Cui, Xumei ^{[1
]}

Li, Yanrong ^{[1
]}

机构：

[1] State Key Lab. of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

来源：

Journal of Materials Science and Technology | 2007年 / 23卷 / 04期

关键词：

Cerium - Characterization - Coatings - Deposition - Electric conductors - Full width at half maximum - Magnetrons - Oxides - Reactive sputtering - Seed - Superconducting films - Surface morphology - Textures - Yttria stabilized zirconia;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

CeO2 seed layer was deposited on rolling-assisted biaxially textured metal substrates by direct-current (DC) magnetron reactive sputtering. The effect of deposition temperature on epitaxial orientation of CeO2 thin films was examined. High quality CeO2 layers were achieved at deposition temperature from 750°C to 850°C. Subsequently yttria-stabilized zirconia (YSZ) and CeO2 films were deposited to complete the buffer layer structure via the same process. The best samples exhibited a highly biaxial texture, as indicated by FWHM (full width half maximum) values in the range of 4°-5°, and 2°-4° for in-plane and out-of-plane orientations, respectively. Secondary ion mass spectrometer analysis confirmed the effective prevention of buffer layer against Ni and W metal interdiffusion. Atomic force microscope observations revealed a smooth, dense and crack-free surface morphology, which provided themselves as the good buffer structure to the YBa2Cu3O7-δ (YBCO) coated conductors.

引用

页码：457 / 460

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