Fault and acceleration test

被引：0
|
作者：
Okamoto H. [1 ]
机构：
[1] Japanese Standard Assoiation (Mita MT BLDG., 3-13-12 Mita, Minatoku, Tokyo
来源：
Journal of Japan Institute of Electronics Packaging | 2018年 / 21卷 / 04期
关键词：
Compendex;
D O I：
10.5104/jiep.21.277
中图分类号：
学科分类号：
摘要：
[No abstract available]
引用
收藏
页码：277 / 280
页数：3
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