A novel analysis method for peak broadening due to thin structures in double crystal X-ray diffraction measurements

被引：0

作者：

Nakashima, K. ^{[1
]}

机构：

[1] NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2001年 / 40卷 / 9 A期

关键词：

D O I：

10.1143/jjap.40.5454

中图分类号：

学科分类号：

摘要：

引用

页码：5454 / 5463

共 50 条

[1] A novel analysis method for peak broadening due to thin structures in double crystal X-ray diffraction measurements
Nakashima, K
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2001, 40 (9A): : 5454 - 5463
[2] A novel method of analyzing peak broadening due to mosaicity for cubic crystals on (001) substrate using double-crystal X-ray diffraction measurements
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[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1997, 30 : 1002 - 1007
[3] A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements
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[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2000, 33 : 1376 - 1385
[4] X-ray diffraction measurement of GaInNAs/GaAs double quantum well structures with novel analysis method for broadening factors
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (9A): : 7167 - 7174
[5] X-ray diffraction measurement of GaInNAs/GaAs double quantum well structures with novel analysis method for broadening factors
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[J]. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2006, 45 (9 A): : 7167 - 7174
[6] A new method for analysing peak broadening caused by compositional fluctuation in X-ray diffraction measurements
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[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2001, 34 : 681 - 690
[7] A simple method for analyzing peak broadening due to tilt and twist distributions in X-ray diffraction measurements of materials of arbitrary type
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[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2008, 41 : 191 - 197
[8] X-RAY DIFFRACTION BROADENING ANALYSIS
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[J]. MACEDONIAN JOURNAL OF CHEMISTRY AND CHEMICAL ENGINEERING, 2015, 34 (01) : 39 - 49
[9] A novel graphical analysis method for double crystal X-ray diffraction measurements of strained layer superlattices grown on (100) substrate
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (08): : 5351 - 5355
[10] A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements (vol 33, pg 1376, 2000)
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