A novel analysis method for peak broadening due to thin structures in double crystal X-ray diffraction measurements

被引：0
|
作者：
Nakashima, K. [1 ]
机构：
[1] NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2001年 / 40卷 / 9 A期
关键词：
D O I：
10.1143/jjap.40.5454
中图分类号：
学科分类号：
摘要：
23
引用
收藏
页码：5454 / 5463
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