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- [41] Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions Journal of Applied Spectroscopy, 2016, 83 : 47 - 50
- [43] Recent developments in electron backscatter diffraction ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 151, 2008, 151 : 363 - 416