A note for advanced analyses of electron backscatter diffraction patterns

被引：0
|
作者：
Umezawa, Osamu [1 ]
Morooka, Satoshi [1 ]
机构：
[1] Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama-shi, Kanagawa 240-8501, Japan
来源：
Keikinzoku/Journal of Japan Institute of Light Metals | 2009年 / 59卷 / 12期
关键词：
Compendex;
D O I：
10.2464/jilm.59.689
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：689 / 696
相关论文
共 50 条
  • [31] Applications of electron backscatter diffraction
    Randle, Valerie
    MATERIALS SCIENCE AND TECHNOLOGY, 2010, 26 (06) : 633 - 634
  • [32] Advanced microstructural analysis of ferrite materials by means of electron backscatter diffraction (EBSD)
    Koblischka-Veneva, A.
    Koblischka, M. R.
    Muecklich, F.
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2010, 322 (9-12) : 1178 - 1181
  • [33] Using electron backscatter diffraction patterns to examine recrystallization in polar ice sheets
    Obbard, Rachel
    Baker, Ian
    Sieg, Katherine
    JOURNAL OF GLACIOLOGY, 2006, 52 (179) : 546 - 557
  • [34] AUTOMATED LATTICE ORIENTATION DETERMINATION FROM ELECTRON BACKSCATTER KIKUCHI DIFFRACTION PATTERNS
    WRIGHT, SI
    ADAMS, BL
    TEXTURES AND MICROSTRUCTURES, 1991, 14 : 273 - 278
  • [35] Investigating crystal orientation patterns of foraminiferal tests by electron backscatter diffraction analysis
    Pabich, Stephanie
    Vollmer, Christian
    Gussone, Nikolaus
    EUROPEAN JOURNAL OF MINERALOGY, 2020, 32 (06) : 613 - 622
  • [36] Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon
    Winkelmann, Aimo
    Nolze, Gert
    ULTRAMICROSCOPY, 2010, 110 (03) : 190 - 194
  • [37] Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations
    Callahan, Patrick G.
    De Graef, Marc
    MICROSCOPY AND MICROANALYSIS, 2013, 19 (05) : 1255 - 1265
  • [38] Simultaneous mapping of cathodoluminescence spectra and backscatter diffraction patterns in a scanning electron microscope
    Edwards, Paul R.
    Kumar, G. Naresh
    McKendry, Jonathan J. D.
    Xie, Enyuan
    Gu, Erdan
    Dawson, Martin D.
    Martin, Robert W.
    NANOTECHNOLOGY, 2024, 35 (39)
  • [39] Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions
    Bazarov, V. V.
    Nuzhdin, V. I.
    Valeev, V. F.
    Vorobev, V. V.
    Osin, Yu. N.
    Stepanov, A. L.
    JOURNAL OF APPLIED SPECTROSCOPY, 2016, 83 (01) : 47 - 50
  • [40] Crystallographic orientation analyses of magnetite thin films using electron backscatter diffraction (EBSD)
    Koblischka-Veneva, A.
    Koblischka, M. R.
    Muecklich, F.
    Murphy, S.
    Zhou, Y.
    Shvets, I. V.
    IEEE TRANSACTIONS ON MAGNETICS, 2006, 42 (10) : 2873 - 2875
12345