Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy

被引:0
|
作者
Cho, Y. [1 ]
Ohara, K. [1 ]
机构
[1] Res. Inst. of Elec. Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
关键词
D O I
10.1143/jjap.40.4349
中图分类号
学科分类号
摘要
Ferromagnetic materials
引用
收藏
页码:4349 / 4353
相关论文
共 50 条
  • [21] Boxcar Averaging Scanning Nonlinear Dielectric Microscopy
    Yamasue, Kohei
    Cho, Yasuo
    NANOMATERIALS, 2022, 12 (05)
  • [22] Intermittent contact scanning nonlinear dielectric microscopy
    Hiranaga, Yoshiomi
    Cho, Yasuo
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (02):
  • [23] Scanning nonlinear dielectric microscopy with nanometer resolution
    Cho, Y
    Kazuta, S
    Matsuura, K
    APPLIED PHYSICS LETTERS, 1999, 75 (18) : 2833 - 2835
  • [24] Scanning nonlinear dielectric microscopy with nanometer resolution
    Cho, Y
    Kazuta, S
    Matsuura, K
    Odagawa, H
    PROCEEDINGS OF THE 2001 12TH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, VOLS I AND II, 2001, : 279 - 282
  • [25] Scanning nonlinear dielectric microscopy with nanometer resolution
    Cho, Y
    Kazuta, S
    Matsuura, K
    Odagawa, H
    JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2001, 21 (10-11) : 2131 - 2134
  • [26] Temperature controlled scanning nonlinear dielectric microscopy
    Ohara, K
    Cho, Y
    ADVANCED DATA STORAGE MATERIALS AND CHARACTERIZATION TECHNIQUES, 2004, 803 : 27 - 33
  • [27] Quantitative microscopy of nonlinear dielectric constant using a scanning evanescent microwave microscopy
    Hu, Bo
    Liu, Wenhan
    Gao, Chen
    Zhu, Xiaohong
    Zheng, Dongning
    APPLIED PHYSICS LETTERS, 2006, 89 (04)
  • [28] Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy
    Chinone, Norimichi
    Yamasue, Kohei
    Hiranaga, Yoshiomi
    Cho, Yasuo
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, 51 (09)
  • [29] Observation of Dopant Profile of Transistors Using Scanning Nonlinear Dielectric Microscopy
    Honda, K.
    Ishikawa, K.
    Cho, Y.
    RELIABILITY AND MATERIALS ISSUES OF SEMICONDUCTOR OPTICAL AND ELECTRICAL DEVICES AND MATERIALS, 2010, 1195
  • [30] Non-contact scanning nonlinear dielectric microscopy
    Ohara, K
    Cho, Y
    NANOTECHNOLOGY, 2005, 16 (03) : S54 - S58