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- [2] A defectivity checkpoint for immersion lithography MICROLITHOGRAPHY WORLD, 2006, 15 (03): : 8 - +
- [3] Analysis and improvement of defectivity in immersion lithography OPTICAL MICROLITHOGRAPHY XIX, PTS 1-3, 2006, 6154 : U2529 - U2540
- [4] Defectivity reduction studies for ArF immersion lithography ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXIV, 2007, 6519
- [5] Immersion defectivity study with volume production immersion lithography tool OPTICAL MICROLITHOGRAPHY XX, PTS 1-3, 2007, 6520
- [7] Innovative metrology for wafer edge defectivity in immersion lithography METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXI, PTS 1-3, 2007, 6518
- [8] The use of unpatterned wafer inspection for immersion lithography defectivity studies METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XX, PTS 1 AND 2, 2006, 6152
- [9] Novel approach for immersion lithography defectivity control to increase productivity METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXII, PTS 1 AND 2, 2008, 6922 (1-2):
- [10] Study on Immersion Lithography Defectivity Improvement in Memory Device Manufacturing METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXIX, 2015, 9424