X-ray diffraction topography. The stages and tendencies of evolution

被引：0

作者：

Shul'pina, I.L. ^{[1
]}

机构：

[1] A. F. Ioffe Physical Technical Inst., St. Petersburg, Russia

来源：

Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 2001年 / 16卷 / 04期

关键词：

Crystal growth - Electronic medical equipment - Imaging techniques - Microoptics - Radiation effects - Synchrotrons - X ray diffraction;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The stages of evolution and physical foundations of X-ray diffraction topography, its methodology, and achievements of the image theory are described. It has been shown that the modern topography is at the new stage due to the use of the radiation obtained in third-generation synchrotrons and the adaptation of the topography to the study of materials of electronic technique. The prospects of its further development have been proposed.

引用

页码：563 / 588

共 50 条

[1] VIDEO DISPLAY TECHNIQUE FOR X-RAY DIFFRACTION TOPOGRAPHY.
Chikawa, J.
Fujimoto, I.
NHK Technical Monograph, 1974, (23): : 3 - 20
[2] HIGH-SPEED X-RAY TOPOGRAPHY.
Eckers, Walter
Oppolzer, Helmut
Siemens Forschungs- und Entwicklungsberichte/Siemens Research and Development Reports, 1977, 6 (01): : 47 - 52
[3] The outlook for x-ray diffraction topography
Shulpina I.L.
Suvorov E.V.
Bulletin of the Russian Academy of Sciences: Physics, 2010, 74 (11) : 1488 - 1496
[4] CHARACTERIZATION OF LiNbO3 SINGLE CRYSTALS BY X-RAY TOPOGRAPHY.
Sugii, Kiyomasa
Miyazawa, Shintaro
Kondo, Susumu
Iwasaki, Hiroshi
Fushimi, Shoichi
Review of the Electrical Communication Laboratories (Tokyo), 1975, 23 (5-6): : 569 - 580
[5] LATTICE DEFECTS IN WELL ANNEALED ALUMINUM REVEALED BY X-RAY TOPOGRAPHY.
Furukawa, Minoru
Miura, Yasuhiro
Kaieda, Hiroya
Journal of Japan Institute of Light Metals, 1979, 29 (05): : 179 - 185
[6] X-Ray Diffraction Topography Methods (Review)
Lider, V. V.
PHYSICS OF THE SOLID STATE, 2021, 63 (02) : 189 - 214
[7] USE OF KINEMATICAL DIFFRACTION IN X-RAY TOPOGRAPHY
ALEXANDROPOULOS, NG
KOTSIS, KT
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1985, 18 (DEC) : 509 - 512
[8] X-ray diffraction topography for materials science
Shul'pina, I. L.
Prokhorov, I. A.
CRYSTALLOGRAPHY REPORTS, 2012, 57 (05) : 661 - 669
[9] Section Methods of X-Ray Diffraction Topography
I. L. Shul’pina
E. V. Suvorov
I. A. Smirnova
T. S. Argunova
Technical Physics, 2023, 68 : 778 - 798
[10] X-Ray Diffraction Topography Methods (Review)
V. V. Lider
Physics of the Solid State, 2021, 63 : 189 - 214

← 1 2 3 4 5 →