X-ray diffraction topography for materials science

被引：13
|
作者：
Shul'pina, I. L. [1 ]
Prokhorov, I. A. [2 ]
机构：
[1] Russian Acad Sci, AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[2] Russian Acad Sci, Res Ctr Space Mat Sci, Branch Shubnikov Inst Crystallog, Kaluga 248640, Russia
来源：
CRYSTALLOGRAPHY REPORTS | 2012年 / 57卷 / 05期
关键词：
SINGLE-CRYSTALS; STRUCTURAL FEATURES; GROWTH STRIATIONS; DISLOCATIONS;
D O I：
10.1134/S106377451205015X
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
In this paper, which is dedicated to the 100th anniversary of the discovery of X-ray diffraction (which occurs in 2012), the role and significance of X-ray diffraction topography for materials science are described. The basic principles, methods, and history of the development of X-ray topography (XRT) are briefly stated. A wide experience of practical application of XRT to study the mechanisms of formation of real structure in bulk single crystals and thin films is summarized. Examples of the application of topography methods for investigating and optimizing the production technology of a variety of practically important materials and microelectronic devices are presented.
引用
收藏
页码：661 / 669
页数：9
相关论文
共 50 条
  • [1] X-ray diffraction topography for materials science
    I. L. Shul’pina
    I. A. Prokhorov
    Crystallography Reports, 2012, 57 : 661 - 669
  • [2] Adaptation of x-ray diffraction topography to new problems in materials science (A survey)
    Shul'pina, IL
    INDUSTRIAL LABORATORY, 1998, 64 (05): : 317 - 321
  • [3] APPLICATION OF X-RAY TOPOGRAPHY TO MATERIALS SCIENCE.
    Weissman, S.
    Sagamore Army Materials Research Conference Proceedings, 1979, : 69 - 100
  • [4] Wide angle X-ray diffraction topography of polycrystalline materials
    Hentschel, MP
    Lange, A
    Schors, J
    Wald, O
    Harbich, KW
    NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS IX, 1999, 497 : 655 - 660
  • [5] X-ray diffraction and refraction topography of light weight materials
    Hentschel, MP
    Lange, A
    Harbich, KW
    Schors, J
    Wald, O
    NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS XI, 2003, : 157 - 166
  • [6] New X-ray diffraction method for materials science
    Swiatek, Z
    Bonarski, JT
    Ciach, R
    Kuznicki, ZT
    THIN SOLID FILMS, 1998, 319 (1-2) : 16 - 19
  • [7] The outlook for x-ray diffraction topography
    Shulpina I.L.
    Suvorov E.V.
    Bulletin of the Russian Academy of Sciences: Physics, 2010, 74 (11) : 1488 - 1496
  • [8] Transient x-ray diffraction and its application to materials science and x-ray optics
    Hauer, AA
    Wark, JS
    Kalantar, D
    Remington, B
    Kopp, R
    Cobble, J
    Failor, B
    Kyrala, G
    Meyers, M
    Springer, R
    Boehley, T
    APPLICATIONS OF X RAYS GENERATED FROM LASERS AND OTHER BRIGHT SOURCES, 1997, 3157 : 72 - 83
  • [9] NDE of micro structured materials by X-ray diffraction and refraction topography
    Hentschel, M. P.
    Harbich, K. -W
    Mueller, B. R.
    Lange, A.
    Schors, J.
    Wald, O.
    EMERGING TECHNOLOGIES IN NON-DESTRUCTIVE TESTING, 2008, : 15 - 22
  • [10] NDE of micro structured materials by X-ray diffraction and refraction topography
    Hentschel, MP
    Lange, A
    Harbich, KW
    Schors, J
    Wald, O
    Mueller, BR
    TESTING, RELIABILITY, AND APPLICATION OF MICRO- AND NANO-MATERIAL SYSTEMS II, 2004, 5392 : 186 - 193
12345