X-ray diffraction topography. The stages and tendencies of evolution

被引：0

作者：

Shul'pina, I.L. ^{[1
]}

机构：

[1] A. F. Ioffe Physical Technical Inst., St. Petersburg, Russia

来源：

Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 2001年 / 16卷 / 04期

关键词：

Crystal growth - Electronic medical equipment - Imaging techniques - Microoptics - Radiation effects - Synchrotrons - X ray diffraction;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The stages of evolution and physical foundations of X-ray diffraction topography, its methodology, and achievements of the image theory are described. It has been shown that the modern topography is at the new stage due to the use of the radiation obtained in third-generation synchrotrons and the adaptation of the topography to the study of materials of electronic technique. The prospects of its further development have been proposed.

引用

页码：563 / 588

共 50 条

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