Variation of optical constants in Ge10Se60Te 30 thin film

被引：0

作者：

Sharma, P. ^{[1
]}

Sharma, V. ^{[1
]}

Katyal, S.C. ^{[1
]}

机构：

[1] Department of Physics, Jaypee University of Information Technology, Waknaghat, Solan, H.P. 173215, India

来源：

| 2000年 / National Institute of Optoelectronics卷 / 09期

关键词：

Defect states - Glass substrates - Optical band gaps - Vacuum evaporation - Glass - Optical conductivity;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Thin films of a-Ge10Se90-xTex (x = 0, 30) glassy alloys are prepared by vacuum evaporation technique at ∼10 -5Torr on glass substrate at room temperature. Optical study is performed to calculate the refractive index (n), extinction coefficient (k), optical conductivity (σ), dielectric constant (real and imaginary), absorption coefficient (α) and optical band gap (Egopt) using transmission spectra in the wavelength range 400-1200 nm.

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