共 50 条
- [41] Feedback scheme for improved lateral force measurement in atomic force microscopy 2008 AMERICAN CONTROL CONFERENCE, VOLS 1-12, 2008, : 3182 - 3187
- [42] Resurrecting dirty atomic force microscopy calibration standards JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (03): : 643 - 647
- [45] Thermal calibration of photodiode sensitivity for atomic force microscopy REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (11):
- [50] Analysis of microstructure of polyamic acid alkylamine salt monolayers by atomic force microscopy and friction force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (01): : 248 - 251