An improved calibration method for friction force in atomic force microscopy

被引:0
|
作者
Tribology Research Institute, National Traction Power Laboratory, Southwest Jiaotong University, Chengdu 610031, China [1 ]
机构
来源
Mocaxue Xuebao/Tribology | 2007年 / 27卷 / 05期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
下载
收藏
页码:472 / 476
相关论文
共 50 条
  • [41] Feedback scheme for improved lateral force measurement in atomic force microscopy
    Shegaonkar, A.
    Lee, C.
    Salapaka, S.
    2008 AMERICAN CONTROL CONFERENCE, VOLS 1-12, 2008, : 3182 - 3187
  • [42] Resurrecting dirty atomic force microscopy calibration standards
    Chernoff, Donald A.
    Sherman, Robert
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (03): : 643 - 647
  • [43] In situ self-calibration of atomic force microscopy
    Kweon, HK
    Gao, W
    Kiyono, S
    NANOTECHNOLOGY, 1998, 9 (02) : 72 - 76
  • [44] In situ self-calibration of atomic force microscopy
    Tohoku Univ, Sendai, Japan
    Nanotechnology, 2 (72-76):
  • [45] Thermal calibration of photodiode sensitivity for atomic force microscopy
    Attard, Phil
    Pettersson, Torbjorn
    Rutland, Mark W.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (11):
  • [46] Calibration of surface stress measurements with atomic force microscopy
    Miyatani, T
    Fujihira, M
    JOURNAL OF APPLIED PHYSICS, 1997, 81 (11) : 7099 - 7115
  • [47] Force calibration in lateral force microscopy
    Cain, RG
    Biggs, S
    Page, NW
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2000, 227 (01) : 55 - 65
  • [48] Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy
    Bhushan, B
    Sundararajan, S
    ACTA MATERIALIA, 1998, 46 (11) : 3793 - 3804
  • [49] Theoretical simulation of atomic-scale friction in atomic force microscopy
    Sasaki, N
    Kobayashi, K
    Tsukada, M
    SURFACE SCIENCE, 1996, 357 (1-3) : 92 - 95
  • [50] Analysis of microstructure of polyamic acid alkylamine salt monolayers by atomic force microscopy and friction force microscopy
    Hamaya, J
    Wakayama, N
    Jikei, M
    Kakimoto, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (01): : 248 - 251