Calibration of surface stress measurements with atomic force microscopy

被引:55
|
作者
Miyatani, T [1 ]
Fujihira, M [1 ]
机构
[1] TOKYO INST TECHNOL,DEPT BIOMOL ENGN,MIDORI KU,YOKOHAMA,KANAGAWA 226,JAPAN
关键词
D O I
10.1063/1.365306
中图分类号
O59 [应用物理学];
学科分类号
摘要
cantilevers for surface stress measurements was investigated. The bending of commercial rectangular cantilevers of the AFM was measured by laser beam deflection under a concentrated load mode and a bending moment mode. Good agreement between the experimental results and the theoretical predictions was obtained. The accurate calibration of the deflection angle for ha was possible with the rectangular cantilever by taking into account the dependence of the deflection angle on the laser spot position, a, on the cantilever. The cyclic voltammogram and the electrocapillary curve were measured in the double layer region of a gold thin film on the rectangular cantilever. In addition, it was concluded that a fairly good measurement of ha by triangular cantilevers was also possible as long as the deflection angle measurement was carried out with the same triangular cantilever at the same laser spot position a. The change in surface stress due to electrochemical oxygen and hydrogen adsorption was also studied on gold and platinum deposited on rectangular cantilevers. In these cases, the change in reflectance of the cantilevers by electrochemical reactions had to be taken into account for accurate calibration. The discussion described here will be also useful for other stimuli, such as pH: that cause the Cantilever bending. (C) 1997 American Institute of Physics.
引用
收藏
页码:7099 / 7115
页数:17
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