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PTCDA adsorption on CaF2 thin films
被引:0
|
作者
:
Rahe P.
论文数:
0
引用数:
0
h-index:
0
机构:
Fachbereich Physik, Universität Osnabrück, Barbarastrasse 7, Osnabrück
Fachbereich Physik, Universität Osnabrück, Barbarastrasse 7, Osnabrück
Rahe P.
[
1
]
机构
:
[1]
Fachbereich Physik, Universität Osnabrück, Barbarastrasse 7, Osnabrück
来源
:
Rahe, Philipp
|
1615年
/ Beilstein-Institut Zur Forderung der Chemischen Wissenschaften卷
/ 11期
关键词
:
3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA);
calcium difluoride;
decoupling;
insulating thin film;
scanning tunnelling microscopy;
D O I
:
10.3762/BJNANO.11.144
中图分类号
:
学科分类号
:
摘要
:
Thin insulating films are commonly employed for the electronic decoupling of molecules as they enable a preservation of the intrinsic molecular electronic functionality. Here, the molecular properties of 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) adsorbed on insulating CaF2 thin films that were grown on Si(111) surfaces are studied. Scanning tunnelling microscopy is used to compare the properties of PTCDA molecules adsorbed on a partly CaF1-covered Si(111) surface with deposition on thicker CaF2/CaF1/Si(111) films. The identification of mostly single molecules on the CaF1/Si(111) interface layer is explained by the presence of atomic-size defects within this layer. Geometry-optimisation calculations using density functional theory reveal a geometry on CaF2(111) of nearly flat-lying PTCDA molecules with two oxygen atoms displaced towards calcium surface ions. This geometry is in agreement with the experimental observations. © 2020 Rahe; licensee Beilstein-Institut. All Rights Reserved.
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页码:1615 / 1622
页数:7
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