Determination of dislocation density in GaN/sapphire layers using XRD measurements carried out from the edge of the sample

被引：0

作者：

Serafińczuk, Jaroslaw ^{[1
,2
]}

Moszak, Karolina ^{[1
]}

Pawlaczyk, Lukasz ^{[2
]}

Olszewski, Wojciech ^{[1
]}

Pucicki, Damian ^{[1
,2
]}

Kudrawiec, Robert ^{[1
,3
]}

Hommel, Detlef ^{[1
,4
]}

机构：

[1] LUKASIEWICZ Research Network, PORT Polish Center for Technology Development, Stablowicka 147, Wroclaw,54-066, Poland

[2] Department of Nanometrology, Wroclaw University of Science and Technology, Janiszewskiego 11/17, Wroclaw,50-372, Poland

[3] Department of Semiconductor Materials Engineering, Wroclaw University of Science and Technology, Wybrzeze Wyspianskiego 27, Wroclaw,50-370, Poland

[4] Institute of Experimental Physics, University of Wroclaw, Pl. Maxa Borna 9, Wroclaw,50-204, Poland

来源：

Journal of Alloys and Compounds | 2020年 / 825卷

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Journal article (JA)

引用

共 34 条

[21] Novel Process for Direct Bonding of GaN onto Glass Substrates using Sacrificial ZnO Template Layers to Chemically Lift-off GaN from c-sapphire
Rogers, D. J.
Ougazzaden, A.
Sandana, V. E.
Moudakir, T.
Ahaitouf, A.
Teherani, F. Hosseini
Gautier, S.
Goubert, L.
Davidson, I. A.
Prior, K. A.
McClintock, R. P.
Bove, P.
Drouhin, H. -J.
Razeghi, M.
OXIDE-BASED MATERIALS AND DEVICES III, 2012, 8263
[22] THE APPROXIMATED DETERMINATION OF THE DENSITY-FUNCTION OF AEROSOLS FROM MEASUREMENTS USING CASCADE IMPACTORS
NEUMANN, HJ
DIRNAGL, K
JOURNAL OF AEROSOL SCIENCE, 1983, 14 (03) : 398 - 402
[23] Determination of the defect density in thin film amorphous and microcrystalline silicon from ESR measurements: The influence of the sample preparation procedure
Xiao, Lihong
Astakhov, Oleksandr
Finger, Friedhelm
Stutzmann, Martin
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2012, 358 (17) : 2078 - 2081
[24] Determination of lateral block size and mosaicity of crystals using X-ray diffraction from the edge of the sample
Serafinczuk, Jaroslaw
CRYSTAL RESEARCH AND TECHNOLOGY, 2016, 51 (04) : 276 - 281
[25] Forward modeling of the internal layers in radio echo sounding using electrical and density measurements from ice cores
Miners, WD
Hildebrand, A
Gerland, S
Blindow, N
Steinhage, D
Wolff, EW
JOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (32): : 6201 - 6204
[26] Direct fracture toughness determination of a ductile epoxy polymer from digital image correlation measurements on a single edge notched bending sample
Allaer, K.
De Baere, I.
Van Paepegem, W.
Degrieck, J.
POLYMER TESTING, 2015, 42 : 199 - 207
[27] DETERMINATION OF X-RAY SPECTRAL DISTRIBUTION FROM TRANSMISSION MEASUREMENTS USING K-EDGE FILTERS
CHU, K
FENSTER, A
MEDICAL PHYSICS, 1983, 10 (06) : 772 - 777
[28] THE DETERMINATION OF ELECTRON-DENSITY PROFILES FROM REFRACTION MEASUREMENTS OBTAINED USING HOLOGRAPHIC-INTERFEROMETRY
TALLENTS, CJ
BURGESS, MDJ
LUTHERDAVIES, B
OPTICS COMMUNICATIONS, 1983, 44 (06) : 384 - 387
[29] Determination of a thermal property of carbon layers from IR measurements in JET NBI test bed using optimisation methods
Daviot, R.
Gauthier, E.
Carpentier, S.
Corre, Y.
Gardarein, J. L.
JOURNAL OF NUCLEAR MATERIALS, 2009, 390-91 : 1070 - 1073
[30] Scale-up of the Chemical Lift-off of (In)GaN-based p-i-n Junctions from Sapphire Substrates Using Sacrificial ZnO Template Layers
Rogers, D. J.
Sundaram, S.
El Gmili, Y.
Teherani, F. Hosseini
Bove, P.
Sandana, V.
Voss, P. L.
Ougazzaden, A.
Rajan, A.
Prior, K. A.
McClintock, R.
Razeghi, M.
OXIDE-BASED MATERIALS AND DEVICES VI, 2015, 9364

← 1 2 3 4 →