Effect of concentration on growth and characterization of chemically deposited ZnO nanostructured thin films

被引：2

作者：

Sales Amalraj A. ^{[1
]}

Christina Joycee S. ^{[2
]}

Senguttuvan G. ^{[3
]}

机构：

[1] Department of Physics, PSNA College of Engineering & Technology, Dindigul

[2] Department of Chemistry, St. Antony’s College of Arts and Sciences for Women, Dindigul

[3] Department of Physics, Anna University Chennai, BIT Campus, Tiruchirappalli

来源：

Materials Research Innovations | 2019年 / 23卷 / 07期

关键词：

molar value; optical; SEM; SILAR; thin films; Word; ZnO;

D O I：

10.1080/14328917.2018.1498209

中图分类号：

学科分类号：

摘要：

In the present work, nanostructured zinc oxide (ZnO) thin films have been successfully deposited onto glass substrates by integrating inexpensive successive ionic layer adsorption and reaction (SILAR) method. The concentration of precursor solution was varied in order to study its effect on structural, morphological and optical properties. The X- ray diffraction (XRD) patterns showed that the films deposited are polycrystalline with preferential orientation along (101) plane. Scanning electron microscope (SEM) images show the growth of well defined vertically oriented ZnO nanorods with diameter and length of ~ 120 nm and ~ 400 nm respectively. The optical study showed that films are highly transparent in the visible region with an average transmission of about ~ 95%. The optical band gap degreased from 3.28eV to 3.101eV on increase in molar concentration. © 2018, © 2018 Informa UK Limited, trading as Taylor & Francis Group.

引用

页码：397 / 401

页数：4

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