Impedance Corrected De-Embedding

被引：3

作者：

Ellison J.J. ^{[1
]}

Agili S.S. ^{[2
]}

机构：

[1] Amphenol, Etters, 17019, PA

[2] Penn State University, Middletown, 17057, PA

来源：

IEEE Electromagnetic Compatibility Magazine | 2022年 / 11卷 / 03期

关键词：

de-embedding; impedance; measurement; S-parameters;

D O I：

10.1109/MEMC.2022.9982534

中图分类号：

学科分类号：

摘要：

The 2x-thru, the most common standard used for creating fixture models, is never identical to the Fixture-DUT-Fixture due to printed circuit board (PCB) process variation. This difference leads to de-embedding error in the frequency and time domain. This paper introduces a method of impedance corrected de-embedding and its associated advantages. Impedance corrected de-embedding removes the error from differences between the Fixture-DUT-Fixture and reference 2x-thru impedance by implementing a peeling process. Further, the method is inherently more robust, because the fixture manufacturing tolerances do not impact the de-embedding results. © 2012 IEEE.

引用

页码：45 / 48

页数：3

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