Impedance Corrected De-Embedding

被引:3
|
作者
Ellison J.J. [1 ]
Agili S.S. [2 ]
机构
[1] Amphenol, Etters, 17019, PA
[2] Penn State University, Middletown, 17057, PA
关键词
de-embedding; impedance; measurement; S-parameters;
D O I
10.1109/MEMC.2022.9982534
中图分类号
学科分类号
摘要
The 2x-thru, the most common standard used for creating fixture models, is never identical to the Fixture-DUT-Fixture due to printed circuit board (PCB) process variation. This difference leads to de-embedding error in the frequency and time domain. This paper introduces a method of impedance corrected de-embedding and its associated advantages. Impedance corrected de-embedding removes the error from differences between the Fixture-DUT-Fixture and reference 2x-thru impedance by implementing a peeling process. Further, the method is inherently more robust, because the fixture manufacturing tolerances do not impact the de-embedding results. © 2012 IEEE.
引用
收藏
页码:45 / 48
页数:3
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