A fully digital timing background calibration algorithm based on first-order auto-correlation for time-interleaved ADCs

被引:0
|
作者
Li, Meng [1 ]
Lv, Fangxu [1 ]
Lai, Mingche [1 ]
Zheng, Xuqiang [2 ]
Huang, Heng [1 ]
Qi, Xingyun [1 ]
Zhang, Geng [1 ]
机构
[1] Natl Univ Def Technol, Changsha 410003, Peoples R China
[2] Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
基金
中国国家自然科学基金;
关键词
Time-interleaved ADC (TI-ADC); Timing-skew calibration; Auto-correlation function based; Fully digital; Background calibration; SAR ADC;
D O I
10.1016/j.mejo.2024.106330
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a fully digital background calibration method for time-interleaved (TI) analog-to-digital converters (ADCs). The timing detector employs a timing detection method based on an enhanced autocorrelation function, combined with matrix operations, to improve the accuracy of timing mismatch acquisition. The algorithm makes full use of the autocorrelation functions of each channel and proposes a more precise method for obtaining autocorrelation derivatives. Furthermore, the algorithm features a simple structure, low computational complexity, and can support timing calibration for any number of channels without requiring additional channels. The algorithm was validated using an ADC + FPGA combined system, with a 8-channel TI-ADC manufactured in 28 nm technology and a sampling rate of 20 GS/s. Results demonstrate that compared to the uncalibrated state, the algorithm significantly improves the SNDR and SFDR from 27.98 dB and 30.76 dB to 39.38 dB and 42.13 dB, respectively when the inputs are near the Nyquist frequency.
引用
收藏
页数:7
相关论文
共 50 条
  • [21] Fully Digital On-Chip Wideband Background Calibration for Channel Mismatches in Time-Interleaved Time-Based ADCs
    Jarvinen, Okko
    Kempi, Ilia
    Unnikrishnan, Vishnu
    Stadius, Kari
    Kosunen, Marko
    Ryynanen, Jussi
    IEEE Solid-State Circuits Letters, 2022, 5 : 9 - 12
  • [22] An efficient digital calibration technique for timing mismatch in time-interleaved ADCs
    Chen Hongmei
    Jian Maochen
    Yin Yongsheng
    Lin Fujiang
    Cui Qing
    IEICE ELECTRONICS EXPRESS, 2016, 13 (13):
  • [23] Fully Digital On-Chip Wideband Background Calibration for Channel Mismatches in Time-Interleaved Time-Based ADCs
    Jarvinen, Okko
    Kempi, Ilia
    Unnikrishnan, Vishnu
    Stadius, Kari
    Kosunen, Marko
    Ryynanen, Jussi
    IEEE SOLID-STATE CIRCUITS LETTERS, 2022, 5 : 9 - 12
  • [24] A background fast convergence algorithm for timing skew in time-interleaved ADCs
    Li, Dengquan
    Zhu, Zhangming
    Zhang, Liang
    Yang, Yintang
    MICROELECTRONICS JOURNAL, 2016, 47 : 45 - 52
  • [25] A Novel Gain Error Background Calibration Algorithm for Time-interleaved ADCs
    Yin, Yongsheng
    Yang, Gang
    Chen, Hongmei
    PROCEEDINGS OF 2014 IEEE INTERNATIONAL CONFERENCE ON ANTI-COUNTERFEITING, SECURITY AND IDENTIFICATION (ASID), 2014, : 42 - 45
  • [26] A Background Correlation-Based Timing Skew Estimation Method for Time-Interleaved ADCs
    Li, Xin
    Wu, Jianhui
    Vogel, Christian
    IEEE ACCESS, 2021, 9 (09): : 45730 - 45739
  • [27] A Digital Background Calibration Algorithm of Time-Interleaved ADC
    Yin, Yongsheng
    Li, Jiayu
    Chen, Hongmei
    PROCEEDINGS OF 2014 IEEE INTERNATIONAL CONFERENCE ON ANTI-COUNTERFEITING, SECURITY AND IDENTIFICATION (ASID), 2014, : 64 - 67
  • [28] A DIGITAL BACKGROUND CALIBRATION METHOD FOR TIME-INTERLEAVED ADCS BASED ON FREQUENCY SHIFTING TECHNIQUE
    Zheng, Yanze
    Mei, Sitao
    Sun, Sicheng
    Zhao, Yijiu
    METROLOGY AND MEASUREMENT SYSTEMS, 2024, 31 (03) : 481 - 495
  • [29] DIGITAL BACKGROUND CALIBRATION FOR TIMING SKEW IN TIME-INTERLEAVED ADC
    Li, Jing
    Liu, Yang
    Wu, Shuangyi
    Ning, Ning
    Yu, Qi
    JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, 2014, 23 (08)
  • [30] A Digital Timing-Mismatch Calibration Technique for Time-Interleaved ADCs Based on a Coordinate Rotational Digital Computer Algorithm
    Kang, Tong
    Zhang, Zhenwei
    Xiong, Wei
    Sun, Lin
    Liu, Yu
    Zhong, Wei
    Lang, Lili
    Shan, Yi
    Dong, Yemin
    ELECTRONICS, 2023, 12 (06)