Probing Italy: A Scanning Probe Microscopy Storyline

被引:2
|
作者
Dinelli, Franco [1 ]
Brucale, Marco [2 ]
Valle, Francesco [2 ]
Ascoli, Cesare [1 ]
Samori, Bruno [3 ]
Sartore, Marco [4 ]
Adami, Manuela [4 ]
Galletti, Riccardo [4 ]
Prato, Stefano [5 ]
Troian, Barbara [5 ]
Albonetti, Cristiano [2 ]
机构
[1] Ist Nazl Ott CNR INO, Consiglio Nazl Ric, Via Moruzzi 1, I-56124 Pisa, Pisa, Italy
[2] Consiglio Nazl Ric Ist Studio Materiali Nanostrutt, Via P Gobetti 101, I-40129 Bologna, Italy
[3] Univ Bologna, Dept Pharm & BioTechnol, Via S Donato 19-2, I-40127 Bologna, Italy
[4] ElbaTech Srl, Via Roma 10, I-57030 Marciana, Italy
[5] APE Res Srl, Area Sci Pk, I-34149 Trieste, Italy
来源
MICRO-SWITZERLAND | 2023年 / 3卷 / 02期
关键词
scanning probe microscopy; atomic force microscopy; scanning tunneling microscopy; STM; AFM; ATOMIC-FORCE; AFM; GROWTH; CELLS; MONOLAYERS; MOLECULES; RESONANCE; GRAPHITE; CONTRAST; SILICON;
D O I
10.3390/micro3020037
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Starting from the late 1980's, scanning probe microscopy has progressively diffused in Italy until today. In this paper, we provide a brief account of the main historical events and a current picture of the distribution of the active groups. A survey was prepared by LimeSurvey, made of six sections asking for personal and institutional data, human resources, equipment available, fields of interest, research projects, educational/dissemination activities, and two relevant publications in the last six years. It turns out that the Italian community includes more than seventy groups and two companies. It is widely diffused, although mostly concentrated near large academic and research institutions, often in locations where prominent Italian researchers have operated. This community is active in many scientific fields and can produce research of high international quality. It shows a wide competence, as proven by the list of research works published in journals ranked within the top 20% class. The diffusion of SPM microscopes in industry is still sporadic, possibly due to extensive collaborations between the research institutions and industries themselves. The authors hope that this work might be useful to the community and beyond, and that it might stimulate the formation of a more structured network.
引用
收藏
页码:549 / 565
页数:17
相关论文
共 50 条
  • [21] Scanning probe microscopy
    Bian, Ke
    Gerber, Christoph
    Heinrich, Andreas J.
    Muller, Daniel J.
    Scheuring, Simon
    Jiang, Ying
    NATURE REVIEWS METHODS PRIMERS, 2021, 1 (01):
  • [22] SCANNING: Probe Microscopy
    Weeks, Brandon L.
    SCANNING, 2008, 30 (02) : 58 - 58
  • [23] SCANNING PROBE MICROSCOPY
    RAYCHAUDHURI, AK
    CURRENT SCIENCE, 1994, 67 (11): : 886 - 887
  • [24] Scanning probe microscopy
    Nature Reviews Methods Primers, 1 (1):
  • [25] Scanning microscopy for mechanical probing
    Andrade, Margareth Spangler
    Metalurgia e Materiais, 2002, 58 (518): : 123 - 125
  • [26] Scanning the Web for scanning probe microscopy
    Miller, S
    ANALYTICAL CHEMISTRY, 2003, 75 (19) : 433A - 434A
  • [27] Probing stress effects in single crystal organic transistors by scanning Kelvin probe microscopy
    Teague, Lucile C.
    Jurchescu, Oana D.
    Richter, Curt A.
    Subramanian, Sankar
    Anthony, John E.
    Jackson, Thomas N.
    Gundlach, David J.
    Kushmerick, James G.
    APPLIED PHYSICS LETTERS, 2010, 96 (20)
  • [28] Probing catalytic surfaces by correlative scanning photoemission electron microscopy and atom probe tomography
    Schweinar, Kevin
    Nicholls, Rachel L.
    Rajamathi, Catherine R.
    Zeller, Patrick
    Amati, Matteo
    Gregoratti, Luca
    Raabe, Dierk
    Greiner, Mark
    Gault, Baptiste
    Kasian, Olga
    JOURNAL OF MATERIALS CHEMISTRY A, 2020, 8 (01) : 388 - 400
  • [29] Probing adhesive, mechanical, and thermal properties of polymer surfaces using scanning probe microscopy
    Dow Chemical Company, Corporate R. and D., Midland, MI 48667, United States
    不详
    不详
    不详
    ACS Symp Ser, (190-211):
  • [30] Optical pump-probe scanning tunneling microscopy for probing ultrafast dynamics on the nanoscale
    S. Yoshida
    Y. Terada
    M. Yokota
    O. Takeuchi
    H. Oigawa
    H. Shigekawa
    The European Physical Journal Special Topics, 2013, 222 : 1161 - 1175