Probing adhesive, mechanical, and thermal properties of polymer surfaces using scanning probe microscopy

被引：0
|
作者：
Dow Chemical Company, Corporate R. and D., Midland, MI 48667, United States [1 ]
不详 [2 ]
不详 [3 ]
不详 [4 ]
机构：
来源：
ACS Symp Ser | / 190-211期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Probing adhesive, mechanical, and thermal properties of polymer surfaces using scanning probe microscopy.
    Meyers, GF
    DeKoven, BM
    Dineen, MT
    Strandjord, A
    O'Connor, PJ
    Hu, T
    Chiao, YH
    Pollock, H
    Hammiche, A
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 216 : U177 - U177
  • [2] Scanning probe microscopy on polymer surfaces
    Klemberg-Sapieha, JE
    PLASMA PROCESSING OF POLYMERS, 1997, 346 : 233 - 245
  • [3] Scanning probe microscopy of polymer surfaces
    Tsukruk, VV
    RUBBER CHEMISTRY AND TECHNOLOGY, 1997, 70 (03): : 430 - 467
  • [4] Characterization of mechanical properties of thin polymer films using scanning probe microscopy
    Xu, J
    Hooker, J
    Adhihetty, I
    Padmanabhan, P
    Chen, W
    FUNDAMENTALS OF NANOINDENTATION AND NANOTRIBOLOGY, 1998, 522 : 217 - 223
  • [5] Probing the temperature dependence of the mechanical properties of polymers at the nanoscale with band excitation thermal scanning probe microscopy
    Nikiforov, M. P.
    Jesse, S.
    Morozovska, A. N.
    Eliseev, E. A.
    Germinario, L. T.
    Kalinin, S. V.
    NANOTECHNOLOGY, 2009, 20 (39)
  • [6] Morphology and mechanical properties of polymer surfaces via scanning force microscopy
    Kajiyama, T
    Tanaka, K
    Ge, SR
    Takahara, A
    PROGRESS IN SURFACE SCIENCE, 1996, 52 (01) : 1 - 52
  • [7] Scanning thermal microscopy for probing local thermal properties of polymers
    Tsukruk, Vladimir V.
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2014, 247
  • [8] Scanning probe acceleration microscopy (SPAM) in fluids: Mapping mechanical properties of surfaces at the nanoscale
    Legleiter, J
    Park, M
    Cusick, B
    Kowalewski, T
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2006, 103 (13) : 4813 - 4818
  • [9] Probing surface microthermal properties by scanning thermal microscopy
    Gorbunov, VV
    Fuchigami, N
    Hazel, JL
    Tsukruk, VV
    LANGMUIR, 1999, 15 (24) : 8340 - 8343
  • [10] Scanning microscopy for mechanical probing
    Andrade, Margareth Spangler
    Metalurgia e Materiais, 2002, 58 (518): : 123 - 125
12345