A Deep-Learning-Based Model for the Detection of Diseased Tomato Leaves

被引:3
|
作者
Abdullah, Akram [1 ]
Amran, Gehad Abdullah [2 ]
Tahmid, S. M. Ahanaf [1 ]
Alabrah, Amerah [3 ]
AL-Bakhrani, Ali A. [4 ]
Ali, Abdulaziz [5 ]
机构
[1] Chongqing Univ Technol, Sch Comp Sci & Engn, Chongqing 400054, Peoples R China
[2] Dalian Univ Technol, Dept Management Sci & Engn, Dalian 116024, Peoples R China
[3] King Saud Univ, Coll Comp & Informat Sci, Dept Informat Syst, Riyadh 11543, Saudi Arabia
[4] Dalian Univ Technol, Coll Software Engn, Dalian 116024, Peoples R China
[5] Wuhan Univ, Sch Remote Sensing & Informat Engn, 129 Luoyu Rd, Wuhan 430079, Peoples R China
来源
AGRONOMY-BASEL | 2024年 / 14卷 / 07期
关键词
YOLOV8s; Ultralytics Hub; detection; diseased leaf; tomato; YOLOV5; YAML file;
D O I
10.3390/agronomy14071593
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
This study introduces a You Only Look Once (YOLO) model for detecting diseases in tomato leaves, utilizing YOLOV8s as the underlying framework. The tomato leaf images, both healthy and diseased, were obtained from the Plant Village dataset. These images were then enhanced, implemented, and trained using YOLOV8s using the Ultralytics Hub. The Ultralytics Hub provides an optimal setting for training YOLOV8 and YOLOV5 models. The YAML file was carefully programmed to identify sick leaves. The results of the detection demonstrate the resilience and efficiency of the YOLOV8s model in accurately recognizing unhealthy tomato leaves, surpassing the performance of both the YOLOV5 and Faster R-CNN models. The results indicate that YOLOV8s attained the highest mean average precision (mAP) of 92.5%, surpassing YOLOV5's 89.1% and Faster R-CNN's 77.5%. In addition, the YOLOV8s model is considerably smaller and demonstrates a significantly faster inference speed. The YOLOV8s model has a significantly superior frame rate, reaching 121.5 FPS, in contrast to YOLOV5's 102.7 FPS and Faster R-CNN's 11 FPS. This illustrates the lack of real-time detection capability in Faster R-CNN, whereas YOLOV5 is comparatively less efficient than YOLOV8s in meeting these needs. Overall, the results demonstrate that the YOLOV8s model is more efficient than the other models examined in this study for object detection.
引用
收藏
页数:13
相关论文
共 50 条
  • [41] Securing Critical Infrastructures: Deep-Learning-Based Threat Detection in IIoT
    Yu, Keping
    Tan, Liang
    Mumtaz, Shahid
    Al-Rubaye, Saba
    Al-Dulaimi, Anwer
    Bashir, Ali Kashif
    Khan, Farrukh Aslam
    IEEE COMMUNICATIONS MAGAZINE, 2021, 59 (10) : 76 - 82
  • [42] HDLNIDS: Hybrid Deep-Learning-Based Network Intrusion Detection System
    Qazi, Emad Ul Haq
    Faheem, Muhammad Hamza
    Zia, Tanveer
    APPLIED SCIENCES-BASEL, 2023, 13 (08):
  • [43] Deep-learning-based in-field citrus fruit detection and tracking
    Zhang, Wenli
    Wang, Jiaqi
    Liu, Yuxin
    Chen, Kaizhen
    Li, Huibin
    Duan, Yulin
    Wu, Wenbin
    Shi, Yun
    Guo, Wei
    HORTICULTURE RESEARCH, 2022, 9
  • [44] Deep-learning-based nanowire detection in AFM images for automated nanomanipulation
    Bai, Huitian
    Wu, Sen
    NANOTECHNOLOGY AND PRECISION ENGINEERING, 2021, 4 (01)
  • [45] A deep-learning-based computer vision solution for construction vehicle detection
    Arabi, Saeed
    Haghighat, Arya
    Sharma, Anuj
    COMPUTER-AIDED CIVIL AND INFRASTRUCTURE ENGINEERING, 2020, 35 (07) : 753 - 767
  • [46] Applying a Deep-Learning-Based Keypoint Detection in Analyzing Surface Nanostructures
    Yuan, Shaoxuan
    Zhu, Zhiwen
    Lu, Jiayi
    Zheng, Fengru
    Jiang, Hao
    Sun, Qiang
    MOLECULES, 2023, 28 (14):
  • [47] Toward Deep-Learning-Based Methods in Image Forgery Detection: A Survey
    Pham, Nam Thanh
    Park, Chun-Su
    IEEE ACCESS, 2023, 11 : 11224 - 11237
  • [48] Using Deep-Learning-based Memory Analysis for Malware Detection in Cloud
    Li, Huhua
    Zhan, Dongyang
    Liu, Tianrui
    Ye, Lin
    2019 IEEE 16TH INTERNATIONAL CONFERENCE ON MOBILE AD HOC AND SENSOR SYSTEMS WORKSHOPS (MASSW 2019), 2019, : 1 - 6
  • [50] Deep-learning-based nanowire detection in AFM images for automated nanomanipulation
    Huitian Bai
    Sen Wu
    Nanotechnology and Precision Engineering, 2021, 4 (01) : 11 - 20