High-speed 2D materials inspection using a microscopic dynamic spectroscopic imaging ellipsometer

被引:0
|
作者
Choi, Sukhyun [1 ,2 ]
Woo, Chae Young [3 ]
Hwang, Gukhyeon [1 ]
Kheiryzadehkhanghah, Saeid [1 ]
Choi, Inho [1 ]
Cho, Yong Jai [2 ]
Lee, Hyung Woo [3 ,4 ,5 ]
Chegal, Won [2 ,6 ]
Kim, Daesuk [1 ]
机构
[1] Jeonbuk Natl Univ, Dept Mech Syst Engn, Jeonju 54896, South Korea
[2] Korea Res Inst Stand & Sci, Semicond Integrated Metrol Team, Daejeon 34113, South Korea
[3] Pusan Natl Univ, Dept Nano Fus Technol, Busan 46241, South Korea
[4] Pusan Natl Univ, Dept Nanoenergy Engn, Busan 46241, South Korea
[5] Pusan Natl Univ, Res Ctr Energy Convergence Technol, Busan 46241, South Korea
[6] Chungnam Natl Univ, Grad Sch Analyt Sci & Technol GRAST, Daejeon 34134, South Korea
基金
新加坡国家研究基金会;
关键词
THICKNESS; GRAPHENE; ELECTRONICS;
D O I
10.1364/AO.527455
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We describe a high-speed two-dimensional (2D) materials inspection method by using a microscopic dynamic spectroscopic imaging ellipsometer. This system employs a high-numerical-aperture (NA) objective telecentric lens module. Unlike conventional spectroscopic imaging ellipsometers, which require relatively long acquisition times due to rotating polarization elements, our proposed system uses a monolithic polarizing interferometric module. This allows it to extract a spatio-spectral ellipsometric phase map A(1, x) of 2D materials like graphene. It achieves a spatial resolution of a few microns at a speed of a few tens of milliseconds. In this study, we demonstrate that the proposed microscopic dynamic spectroscopic imaging ellipsometer can provide spectroscopic ellipsometric phase data A(1) with 165 spectral bands in the visible range. It inspects a monolayer graphene flake area of 2.5 mm & lowast; 1.65 mm in just 1 min, which is the fastest 2D materials inspection capability ever reported, to our knowledge. (c) 2024 Optica Publishing Group
引用
收藏
页码:7135 / 7144
页数:10
相关论文
共 50 条
  • [21] High-speed ultrasound 2D-imaging camera
    Svet, VD
    Sizov, VI
    Baykov, SV
    ACOUSTICAL IMAGING, VOL 23, 1997, 23 : 255 - 260
  • [22] Dynamic spectroscopic imaging ellipsometer for high-throughput full patterned wafer mapping
    Hwang, G.
    Kheiryzadehkhanghah, S.
    Choi, S.
    Choi, I.
    Kim, S.
    Kim, D.
    METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII, 2024, 12955
  • [23] High flux neutron imaging for high-speed radiography, dynamic tomography and strongly absorbing materials
    Hillenbach, A
    Engelhardt, M
    Abele, H
    Gähler, R
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 542 (1-3): : 116 - 122
  • [24] 2D polymer LC as a high-speed, high-throughput application
    Adler, Martina
    Kilz, Peter
    LC GC EUROPE, 2006, 19 (10) : 552 - +
  • [25] Smart Inspection Monitoring Using High-Speed Camera
    Shimasaki K.
    Wang F.
    Ishii I.
    Journal of Japan Institute of Electronics Packaging, 2024, 27 (02) : 187 - 191
  • [26] High-speed inspection of rails using ACFM techniques
    Papaelias, M. Ph.
    Lugg, M. C.
    Roberts, C.
    Davis, C. L.
    NDT & E INTERNATIONAL, 2009, 42 (04) : 328 - 335
  • [27] Research on the Mechanical Efficiency of High-Speed 2D Piston Pumps
    Huang, Yu
    Ruan, Jian
    Zhang, Chenchen
    Ding, Chuan
    Li, Sheng
    PROCESSES, 2020, 8 (07)
  • [28] Linear and 2D arrays for Focused Laser Differential Interferometry using a high-speed camera
    Holladay, Seth
    Zhang, Zhili
    OPTICS COMMUNICATIONS, 2023, 546
  • [29] 2D ADAPTIVE FEM SIMULATION OF FAILURES IN HIGH-SPEED IMPACTS
    Issa, M.
    Saanouni, K.
    Labergere, C.
    Rassineux, A.
    COMPUTATIONAL PLASTICITY XI: FUNDAMENTALS AND APPLICATIONS, 2011, : 56 - 65
  • [30] Flow monitoring in high-speed networks with 2D hash tables
    Nguyen, D
    Zambreno, J
    Memik, G
    FIELD-PROGRAMMABLE LOGIC AND APPLICATIONS, PROCEEDINGS, 2004, 3203 : 1093 - 1097