Radiated Emissions Prediction of an Electronic Packaging Based on Near- field Scanning

Integrated circuits (ICs) on printed circuit board (PCB) cause electromagnetic interference problems, source reconstruction method (SRM) based on near-field scanning is an accurate and efficient method to evaluate the radiated emissions of original ICs, by replacing them with simplified equivalent Hertz dipoles. The radiated emissions of Hertz dipoles can be easily obtained in simulation or by formula. Ideally, the radiated emissions of Hertz dipoles can be used to predict that of original ICs. One of the SRMs, dynamic differential evolution optimization method is verified with two typical applications. Most absolute error are below 2 dB which elaborates the proposed method meets most industrial requirements.