Growth Mechanism of N-Polar GaN on Vicinal N-Polar AlN Templates in Metal-Organic Vapor Phase Epitaxy

被引:0
|
作者
Miyamoto, Minagi [1 ]
Hanasaku, Koki [1 ]
Kowaki, Taketo [1 ]
Inahara, Daisuke [1 ]
Zazuli, Aina Hiyama [1 ]
Fujii, Kai [1 ]
Kimoto, Taisei [1 ]
Ninoki, Ryosuke [1 ]
Kurai, Satoshi [1 ]
Okada, Narihito [1 ]
Yamada, Yoichi [1 ]
机构
[1] Yamaguchi Univ, Grad Sch Sci & Technol Innovat, 2 16 1 Tokiwadai, Ube, Yamaguchi 7558611, Japan
关键词
metal-organic vapor phase epitaxies (MOVPEs); N-polar AlN; N-polar GaN; ELECTRON-MOBILITY TRANSISTORS; BREAKDOWN VOLTAGE; SUBSTRATE; GASES; HEMTS;
D O I
10.1002/pssa.202400055
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, nitrogen-polar (N-polar) GaN/Al0.9Ga0.1N/aluminum nitride (AlN) structures are grown on a sapphire substrate with an offcut angle of 2.0 degrees from the m axis using metal-organic vapor phase epitaxy. Low-growth temperatures of N-polar GaN result in a shorter Ga-migration length, and 2D GaN growth is successfully achieved. The growth temperature and V/III ratio dependence are investigated for N-polar GaN. As a result, high-quality and flat N-polar GaN is successfully grown at a low temperature of 650 degrees C at a high V/III ratio and nonequilibrium conditions. Through X-ray reciprocal space mapping, N-polar GaN can be grown coherently on a N-polar AlN template at low temperatures around 650 degrees C, relaxing at higher temperatures. N-polar GaN is successfully grown 2D at low temperatures. The optimum V/III ratio depends on the growth temperature, with lower V/III ratios suitable for growth temperatures of 800 degrees C and higher V/III ratios for 650 degrees C. The metal-organic vapor phase epitaxy method shows superiority in the growth of N-polar GaN rather than that of metal-polar GaN.image (c) 2024 WILEY-VCH GmbH
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页数:6
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