An Overview of Computing-in-Memory Circuits With DRAM and NVM

被引:6
|
作者
Kim, Sangjin [1 ]
Yoo, Hoi-Jun [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Sch Elect Engn, Daejeon 34141, South Korea
关键词
Computing-in-memory; dynamic random access memory; non-volatile memory; magnetic random access memory; resistive random access memory; phase change memory; hardware for artificial intelligence; SRAM MACRO;
D O I
10.1109/TCSII.2023.3333851
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Computing-in-memory (CIM) has emerged as an energy-efficient hardware solution for machine learning and AI. While static random access memory (SRAM)-based CIM has been prevalent, growing attention is directed towards leveraging dynamic random access memory (DRAM) and non-volatile memory (NVM) with its unique characteristics such as high-density and non-volatility. This brief reviews the evolving trends in DRAM and NVM-based CIM, which have faced unique challenges that arise from SRAM despite their advantages. For instance, the DRAM cell's density comes with leakage and refresh issues, impacting efficiency and computing accuracy. NVM-CIM faces computing accuracy challenges of resistance-based computation with low signal margins and non-linear characteristics. This tutorial discusses the current status and future directions in DRAM-CIM and NVM-CIM research, which address the abovementioned challenge.
引用
收藏
页码:1626 / 1631
页数:6
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