Effect of n-type Cl doping on electrical conductivity of few layer WS2

被引:0
|
作者
Roy, Arpita [1 ]
Sharma, Santanu [1 ]
Mondal, Biplob [1 ]
机构
[1] Tezpur Univ, Dept Elect & Commun Engn, Tezpur 784028, Assam, India
关键词
FIELD-EFFECT TRANSISTOR; CONTACT RESISTANCE; MONOLAYER MOS2; PERFORMANCE; REDUCTION;
D O I
10.1007/s00542-024-05683-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The work reported here focuses on improving the electrical conductivity of tungsten disulfide (WS2) nanosheets by n-type impurity doping. The WS2 is a 2D transition metal dichalcogenide material which possess desirable properties such as high mobility and bandgaps, making them potential candidates for future semiconductor device applications. However, the presence of sulfur vacancies in semiconductor and weak binding energy at the metal-semiconductor interface often results in a high Schottky barrier height (SBH) leading to poor electrical conductivity. To overcome this issue, the research focusses on investigating the reduction of SBH at the junction between WS2 and metal. The effect of time dependent chlorine (Cl) doping on the SBH of exfoliated WS2 was studied through I-V measurement at different temperatures. The results indicate SBH reduction from 0.75 eV for undoped to 0.65 eV for Cl doped samples. Overall, the study demonstrates that Cl doping can effectively decrease the Schottky barrier height of WS2 thin-film, leading to enhanced electrical transport properties. The mechanism involved in the modulation of electronic property of the system is also explained with the help of an energy band model. These findings contribute to the understanding and advancement of high-performance semiconductor devices established on the n-type doping of WS2 thin film.
引用
收藏
页码:1121 / 1131
页数:11
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