X-Ray Image Generation as a Method of Performance Prediction for Real-Time Inspection: a Case Study

被引:0
|
作者
Andriiashen, Vladyslav [1 ]
van Liere, Robert [1 ,2 ]
van Leeuwen, Tristan [1 ,3 ]
Batenburg, K. Joost [1 ,4 ]
机构
[1] Ctr Wiskunde Informat, Computat Imaging, Sci Pk 123, NL-1098 XG Amsterdam, Netherlands
[2] Tech Univ Eindhoven, Fac Wiskunde Informat, Groene Loper 5, NL-5612 AZ Eindhoven, Netherlands
[3] Univ Utrecht, Math Inst, Budapestlaan 6, NL-3584 CD Utrecht, Netherlands
[4] Leiden Univ, Leiden Inst Adv Comp Sci, Niels Bohrweg 1, NL-2333 CA Leiden, Netherlands
关键词
X-ray inspection; System Design; Dual-energy X-ray; Deep Convolutional neural networks; Probability of detection; NOISE; OPTIMIZATION; SIMULATION; CT;
D O I
10.1007/s10921-024-01091-8
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
X-ray imaging can be efficiently used for high-throughput in-line inspection of industrial products. However, designing a system that satisfies industrial requirements and achieves high accuracy is a challenging problem. The effect of many system settings is application-specific and difficult to predict in advance. Consequently, the system is often configured using empirical rules and visual observations. The performance of the resulting system is characterized by extensive experimental testing. We propose to use computational methods to substitute real measurements with generated images corresponding to the same experimental settings. With this approach, it is possible to observe the influence of experimental settings on a large amount of data and to make a prediction of the system performance faster than with conventional methods. We argue that a high accuracy of the image generator may be unnecessary for an accurate performance prediction. We propose a quantitative methodology to characterize the quality of the generation model using Probability of Detection curves. The proposed approach can be adapted to various applications and we demonstrate it on the poultry inspection problem. We show how a calibrated image generation model can be used to quantitatively evaluate the effect of the X-ray exposure time on the performance of the inspection system.
引用
收藏
页数:13
相关论文
共 50 条
  • [31] REAL-TIME HIGH-ENERGY X-RAY INSPECTION SYSTEM - FIELD EXPERIENCES AND IMPROVEMENTS
    BARRY, R
    KINCHEN, B
    MATERIALS EVALUATION, 1980, 38 (02) : S8 - S8
  • [32] Automated Threat Objects Detection with Synthetic Data for Real-Time X-ray Baggage Inspection
    Chaturvedi, Kunal
    Braytee, Ali
    Vishwakarma, Dinesh Kumar
    Saqib, Muhammad
    Mery, Domingo
    Prasad, Mukesh
    2021 INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS (IJCNN), 2021,
  • [33] X-RAY REAL-TIME IMAGING FOR WELD INSPECTION - 2ND REPORT.
    Anon
    Rivista Italiana della Saldatura, 1987, 39 (02): : 135 - 137
  • [34] Kinetics of antigorite dehydration: A real-time X-ray diffraction study
    Perrillat, JP
    Daniel, I
    Koga, KT
    Reynard, B
    Cardon, H
    Crichton, WA
    EARTH AND PLANETARY SCIENCE LETTERS, 2005, 236 (3-4) : 899 - 913
  • [35] Real-time in situ x-ray diffraction as a method to control epitaxial growth
    Bader, AS
    Faschinger, W
    Schumacher, C
    Geurts, J
    Molenkamp, LW
    Neder, RB
    Karczewski, G
    APPLIED PHYSICS LETTERS, 2003, 82 (26) : 4684 - 4686
  • [36] Three-TFT image sensor for real-time digital X-ray imaging
    Safavian, N
    Chaji, GR
    Nathan, A
    Rowlands, JA
    ELECTRONICS LETTERS, 2006, 42 (03) : 150 - 151
  • [37] Real-time image processing platform for the correction of X-ray detector related artifacts
    Jung, N
    Gipp, T
    Jacobs, H
    Paul, H
    MEDICAL IMAGING 1999: PHYSICS OF MEDICAL IMAGING, PTS 1 AND 2, 1999, 3659 : 974 - 985
  • [38] INVESTIGATION ON THE REAL-TIME PSEUDOCOLOR DISPLAY OF 3-DIMENSIONAL X-RAY IMAGE
    ZHANG, S
    ZHANG, G
    SCIENTIA SINICA SERIES A-MATHEMATICAL PHYSICAL ASTRONOMICAL & TECHNICAL SCIENCES, 1983, 26 (07): : 777 - 784
  • [39] Quantifying the effect of X-ray scattering for data generation in real-time defect detection
    Andriiashen, Vladyslav
    van Liere, Robert
    van Leeuwen, Tristan
    Batenburg, Kees Joost
    JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY, 2024, 32 (04) : 1099 - 1119
  • [40] HIGH-RESOLUTION REAL-TIME X-RAY TOPOGRAPHY OF DISLOCATION GENERATION IN SILICON
    CHANG, SL
    QUEISSER, HJ
    BAUMGART, H
    HAGEN, W
    HARTMANN, W
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (06): : 1009 - 1013