Multiple Adjacent Bit Error Detection and Correction Codes for Reliable Memories: A Review

被引：0
|
作者：
Neelima, K. [1 ]
Subhas, C. [2 ]
机构：
[1] Department of ECE, JNTUA, Anantapuramu,515002, India
[2] Professor and Head of ECE Department, Vice-Principal, JNTUA College of Engineering, Kalikiri,517234, India
来源：
Lecture Notes in Electrical Engineering | 2021年 / 722 LNEE卷
关键词：
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Critical component - Decoding process - Erroneous datum - Error detecting and correcting codes - Error detection and correction codes - Error masking - Multiple bit upset - Review papers
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页码：357 / 371
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