LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION OF TIN OXIDE THIN-FILMS FROM AN ORGANOMETALLIC COMPOUND - APPLICATION TO GAS-DETECTION

被引:0
|
作者
PIJOLAT, C
BRUNO, L
LALAUZE, R
机构
来源
JOURNAL DE PHYSIQUE IV | 1991年 / 1卷 / C2期
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O4 [物理学];
学科分类号
0702 ;
摘要
Tin dioxide SnO2 is one of the most common materials used in the fabrication of semiconductor gas sensors The principle of such sensors is based upon the variations of conductivity induced by adsorption of various gases. A low pressure OMCVD apparatus has been developed in order to obtain tin dioxide thin films. Structural and electrical properties have been investigated by different techniques: S.E.M., X-ray diffraction and conductivity measurements in different atmospheres. A correlation is found between the deposition parameters and the electrical properties of CVD-SnO2 thin films.
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页码:303 / 310
页数:8
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