RADIATION HARDENING OF VLSI-ELECTRONICS

被引：0
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作者：
WULF, F
BRAUNIG, D
BODEN, A
机构：
来源：
ECFA STUDY WEEK ON INSTRUMENTATION TECHNOLOGY FOR HIGH-LUMINOSITY HADRON COLLIDERS, PROCEEDINGS VOLS 1-2 | 1989年 / 89卷
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中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
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页码：681 / 684
页数：4
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