RADIATION HARDENING OF VLSI-ELECTRONICS

被引：0

作者：

WULF, F

BRAUNIG, D

BODEN, A

机构：

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D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：681 / 684

页数：4

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